Quality Controlby Microworks Semiconductor Analysis Center
01
Incoming inspection
-
Using huge semiconductor database
Labels inspection
Bar-codes inspection
Packing condition inspection
Risk Assessment : ESD, MSL
X-ray inspection
02
Detailed inspection
-
Microscope inspection
Plating inspection
Top marking inspection
Package inspection
Surface inspection
-
Microscope
-
Vacuum Seal Machine
-
X-ray semiconductor inspection
-
Constant Temp &
Humidity Chamber
03
Semiconductor Analysis
-
X-ray
Decapsulation
Electrical bench test
Custom Analysis
Blacktop (Scrape)
-
Blacktop (Scrape)
-
X-ray
-
Optical Inspection
-
Electrical bench test